A new beam position monitor for synchrotron
Antonio Pereira (Thin Film team), Christophe Dujardin (Luminescence team) and Mriana Levinta (Internship NSE) in collaboration with colleagues from ESRF have published an article entitled « Low-absorption, multi-layered scintillating material for high resolution real-time X-ray beam analysis » in the Journal of Material Chemistry C.
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Synchrotron radiation facilities offer all around the world a unique tool for X-ray analysis of matter. One of the major limitations for the improvement in performance is due to the incident X-ray beam fluctuations in terms of position, intensity and shape. Using Pulsed Laser Deposition on porous membranes, the authors introduce a functional device, a multilayer scintillating screen, that succeeds in satisfying three important criteria: high X-ray transparency and high overall efficiency, which are not easily reconcilable with existing devices, as well as high spatial resolution capability. This multilayer device enables online measurement of the beam parameters with a frame rate of 50ms. |
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20/04/2015