Profil

Nom:Name:VINCENT Pascal
Position:Position:Enseignant-chercheur
Mel:Mail:pascal.vincent[at]univ-lyon1.fr
Equipe:Team:Physique des Nanostructures et Emission de Champ
Bureau(x):Office(s):BRILLOUIN / 5ème / 15-011
Tél(s):Phone(s):0472432782
15 publications à l'ILM ces 5 dernières années. 15 publications at ILM in the last 5 years. Voir les 49 publications des 15 dernières années. See 49 publications from the last 15 years.

69 publication(s) affichée(s) 69 publication(s) shown
Thermal properties of nano-objects by means of scanning thermal microscopy BIB HAL
Thermal properties of nano-objects by means of scanning thermal microscopy BIB HAL
Antonin Massoud, Valeria Lacatena, Maciej Haras, Christian Mateo Frausto-Avila, Jose Manuel Sojo Gordillo, Gerard Gadea-Diez, Stéphane Monfray, Jean-Marie Bluet, J.F. Robillard, Victor Arellano-Arreola, Jose Martin Yañez Limon, Andres de Luna Bugallo, David Renahy, Marc Salleras, Carolina Duque Sierra, P. Vincent, Luisa Fonseca, Alex Morata, Albert Tarancón, Séverine Gomés, Pierre-Olivier Chapuis
(2025)
Electric fields, forces, and modification of the tunnel barrier during field electron emission and field evaporation from single-wall carbon nanotubes BIB HAL DOI
Vladimir Pimonov, Federico Panciera, Goulven Rouille, Catherine Weng, Sorin Perisanu, Costel Sorin Cojocaru, Haifa Taoum, Chen Wei, Salvador Barranco Carceles, Victor Verdugo-Gutiérrez, Ilias Aguili, Jean Francois Sivignon, Nicholas Blanchard, Pierre Legagneux, Stephen Thomas Purcell, Anthony Ayari, P. Vincent
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics, vol. 43, p. 043202, (2025)
Is the linear relationship between the slope and intercept observed in field emission S-K plots an artifact? BIB HAL DOI
Anthony Ayari, P. Vincent, Sorin Perisanu, Poncharal Philippe, Stephen Thomas Purcell
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics, vol. 42, p. 053201, (2024)
Origin of the Slope-Intercept Linear Relationship in Field Emission BIB HAL DOI
Anthony Ayari, P. Vincent, Sorin Perisanu, Poncharal Philippe, Stephen Thomas Purcell
p. 1-2, (2024)
Local heat dissipation and elasticity of suspended silicon nanowires revealed by dual scanning electron and thermal microscopies BIB HAL DOI
Jose M Sojo-Gordillo, Gerard Gadea-Diez, David Renahy, Marc Salleras, Carolina Duque-Sierra, P. Vincent, Luis Fonseca, Pierre-Olivier Chapuis, Alex Morata, Séverine Gomés, Albert Tarancón
Small, vol. 20, p. 2305831, (2024)
Field emission characterization of field-aligned carbon nanotubes synthesized in an environmental transmission electron microscope BIB HAL DOI
P. Vincent, Federico Panciera, Ileana Florea, Anthony Ayari, Sorin Perisanu, Costel Sorin Cojocaru, Haifa Taoum, Chen Wei, Khakimjon Saidov, Utkur Mirsaidov, Ilias Aguili, Nicholas Blanchard, Pierre Legagneux, Stephen Thomas Purcell
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics, vol. 42, p. 022802, (2024)
How Accurate is a Field Emission Experiment? BIB HAL DOI
Anthony Ayari, P. Vincent, Sorin Perisanu, Poncharal Philippe, Stephen Purcell
p. 227-229, (2023)
In-Situ Direct Observation of Carbon Nanotube Synthesis Under Electric Field and Their Field Emission Performance BIB HAL DOI
P. Vincent, Federico Panciera, Ileana Florea, Costel Cojocaru, Sorin Perisanu, Anthony Ayari, Julien Chaste, Pierre Legagneux, Stephen Purcell
p. 120-121, (2023)
All field emission experiments are noisy, … are any meaningful? BIB HAL DOI
Anthony Ayari, P. Vincent, Sorin Perisanu, Poncharal Philippe, Stephen Purcell
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics, vol. 41, p. 024001, (2023)
All field emission models are wrong, … but are any of them useful? BIB HAL DOI
Anthony Ayari, P. Vincent, Sorin Perisanu, Poncharal Philippe, Stephen T Purcell
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics, vol. 40, p. 024001, (2022)
Negative differential resistance in photoassisted field emission from Si nanowires BIB HAL DOI
M. Choueib, A. Derouet, P. Vincent, Anthony Ayari, S. Perisanu, P. Poncharal, Costel Sorin Cojocaru, R. Martel, S. Purcell
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics, vol. 40, p. 022802, (2022)
Does a banal tungsten field emitter obey the field emission theory? BIB HAL DOI
Anthony Ayari, P. Vincent, Sorin Perisanu, Poncharal Philippe, Stephen Purcell
p. 1-2, (2021)
Field Emission from Genuine Graphene: An Experimental Study BIB HAL DOI
Poncharal Philippe, Anthony Ayari, P. Vincent, Sorin Perisanu, Stephen Purcell
p. 1-2, (2021)
Negative Differential Resistance in Laser-Assisted Field Emission from Si Nanowires BIB HAL DOI
M. Choueib, A. Derouet, P. Vincent, Anthony Ayari, Poncharal Philippe, Costel Sorin Cojocaru, R. Martel, S.T. Purcell
p. 1-2, (2021)
Accounting for variance in machine learning benchmarks BIB HAL
Accounting for variance in machine learning benchmarks BIB HAL
Xavier Bouthillier, Pierre Delaunay, Mirko Bronzi, Assya Trofimov, Brennan Nichyporuk, Justin Szeto, Naz Sepah, Edward Raff, Kanika Madan, Vikram Voleti, Samira Ebrahimi Kahou, Vincent Michalski, Dmitriy Serdyuk, Tal Arbel, Chris Pal, Gaël Varoquaux, P. Vincent
(2021)
Giant, Voltage Tuned, Quality Factors of Single Wall Carbon Nanotubes and Graphene at Room Temperature BIB HAL DOI
A. Descombin, Poncharal Philippe, A. Pascale-Hamri, M. Choueib, R. Diehl, P. Vincent, S. T. Purcell, Anthony Ayari, S. Perisanu
Nano Letters, vol. 19, p. 1534-1538, (2019)
New tools for advance in thermal nanometrology using scanning thermal microscopy (SThM) BIB HAL
New tools for advance in thermal nanometrology using scanning thermal microscopy (SThM) BIB HAL
Eloïse Guen, Pierre-Olivier Chapuis, David Renahy, P. Vincent, Stéphane Lefèvre, Séverine Gomés
(2018)
Quality factor enhancement of Nanoelectromechanical systems by capacitive driving beyond the resonance BIB HAL DOI
Thomas Barois, Sorin Perisanu, Poncharal Philippe, P. Vincent, Stephen T. Purcell, Anthony Ayari
Physical Review Applied, vol. 6, p. 014012, (2016)
A Combined SThM/SEM Instrument For The Investigation Of Influent Parameters In Nano-scale Thermal Contact BIB HAL
A Combined SThM/SEM Instrument For The Investigation Of Influent Parameters In Nano-scale Thermal Contact BIB HAL
S. Gomès, D. Renahy, P. Vincent
(2016)
A Universal and Ultrasensitive Vectorial Nanomechanical Sensor For Imaging 2D Force Fields BIB HAL DOI
Laure Mercier de Lépinay, Benjamin Pigeau, Benjamin Besga, P. Vincent, Poncharal Philippe, O Arcizet
Nature Nanotechnology, vol. 12, p. 156-162, (2016)
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