Profil

Nom:

Name:

LYSENKO Volodymyr

Equipe(s):

Team(s):

Formation, élaboration de nanomatériaux et cristaux

Position:

Chercheur

Bureau(x):

Office(s):

RAULIN / RdC / 10-018

Mel:

Mail:

vladimir.lysenko@univ-lyon1.fr

Preparation, Luminescent Properties and Bioimaging Application of Quantum Dots Based on Si and SiC

V. Skryshevsky, T. Serdiuk, Yuriy Zakharko, S. Alekseev, Alain Géloën, Vladimir Lysenko

(2014)

Trypsinization-dependent cell labeling with fluorescent nanoparticles

T. Serdiuk, S. Alekseev, Vladimir Lysenko, V. Skryshevsky, Alain Géloën

Nanoscale Research Letters, vol. 9, p568 (2014)

Damage creation in porous silicon irradiated by swift heavy ions

Bruno Canut, M. Massoud, Pascal Newby, Vladimir Lysenko, Luc Frechette, Jean-Marie Bluet, Isabelle Monnet

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 327, p99-102 (2014)

Thermal conductivity of meso-porous germanium

Mykola Isaiev, Sergii Tutashkonko, Valentin Jean, Konstantinos Termentzidis, Tetyana Nychyporuk, Dmitriy Andrusenko, O. Marty, R. Burbelo, David Lacroix, Vladimir Lysenko

Applied Physics Letters, vol. 105, p105 / 5p. (2014)

Fluorescent (Au@SiO2)SiC Nanohybrids: Influence of Gold Nanoparticle Diameter and SiC Nanoparticle Surface Density

Ning Sui, Virginie Monnier, Yuriy Zakharko, Yann Chevolot, Sergei Alekseev, Jean-Marie Bluet, Vladimir Lysenko, Eliane Souteyrand

Plasmonics, vol. 8, p85 - 92 (2013)

Amorphization and reduction of thermal conductivity in porous silicon by irradiation with swift heavy ions

Pascal J Newby, Bruno Canut, Jean-Marie Bluet, Séverine Gomés, Mykola Isaiev, Roman Burbelo, Konstantinos Termentzidis, Patrice Chantrenne, Luc Frechette, Vladimir Lysenko

Journal of Applied Physics, vol. 114, p014903 (2013)

Characterization of the thermal conductivity of insulating thin films by Scanning Thermal Microscopy

Séverine Gomés, P. Newby, Bruno Canut, K. Termentzidis, O. Marty, Luc Frechette, Patrice Chantrenne, Vincent Aimez, Jean-Marie Bluet, Vladimir Lysenko

Microelectronics Journal, vol. 44, p1029-1034 (2013)